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A reconfigurable SAT-based automatic test pattern generator
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1 Neural Network Automatic Test Pattern Generator Priyanka Sinha Department of Electrical and Computer Engineering, Auburn University 200 Broun Hall, AL-36849 ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an
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Automatic og test and compensation with built-in pattern generator and yzer Abstract. A built-in-self test (BIST) scheme for og circuitry functionality Patent application title: TEST APPARATUS, PATTERN GENERATOR, TEST METHOD AND PATTERN GENERATING METHOD Inventors: Eiji Harada (Kanagawa, JP) Assignees: NEC The present invention relates to algorithmic pattern generators in automatic test equipment for testing memory an algorithmic test pattern generator (APG)
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A reconfigurable SAT-based automatic test pattern generator Full Text Sign In this paper, we propose a reconfigurable hardware SAT-based test pattern generator. ATPG – Automatic Test Pattern Generator CRC – Cyclic Redundancy Checking CUT – Circuit (Component) Under Test DFT – Design For Test DUT – Design Under Test TRF-950 – Analog & Digital Multistandard Test Pattern Generator The TRF-950 is universal multistandard equipment suitable for both og and digital TV systems.
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